Wavefront and ray-density plots using seventh-order matrices
نویسندگان
چکیده
منابع مشابه
Wavefront and ray-density plots using seventh-order matrices
The optimization of an optical system benefits greatly from a study of its aberrations and an identification of each of its elements’ contribution to the overall aberration figures. The matrix formalism developed by one of the authors was the object of a previous paper and allows the expression of image-space coordinates as high-order polynomials of object-space coordinates. In this paper we ap...
متن کاملQuadratic canonical transformation theory and higher order density matrices.
Canonical transformation (CT) theory provides a rigorously size-extensive description of dynamic correlation in multireference systems, with an accuracy superior to and cost scaling lower than complete active space second order perturbation theory. Here we expand our previous theory by investigating (i) a commutator approximation that is applied at quadratic, as opposed to linear, order in the ...
متن کاملX-ray wavefront characterization with two-dimensional wavefront sensors: shearing interferometers and Hartmann wavefront sensors
Phase reconstructions from a two-dimensional shearing inter-ferometer, based on two orthogonal phase gratings in a single plane, and a Hartmann sensor are compared. Design alternatives for both wavefront sensors are given, and simulated performance of both the two-dimensional x-ray shearing interferometer and Hartmann wavefront sensor are presented for two different phase profiles. The first co...
متن کاملImproved Seventh-Order WENO Scheme
In this paper, an improved seventh-order WENO (WENO-Z7) scheme is suggested by extending the 5th-order WENO scheme of Borges et al[R. Borges, M. Carmona, B. Costa, W. S. Don, An improved weighted essentially non-oscillatory scheme for hyperbolic conservation laws, J. Comput. Phys. 227(2008) 3191-3211]. The sufficient condition for seventh-order accuracy is described for the new smoothness indic...
متن کاملX-ray pulse wavefront metrology using speckle tracking.
An instrument allowing the quantitative analysis of X-ray pulsed wavefronts is presented and its processing method explained. The system relies on the X-ray speckle tracking principle to accurately measure the phase gradient of the X-ray beam from which beam optical aberrations can be deduced. The key component of this instrument, a semi-transparent scintillator emitting visible light while tra...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Optik
سال: 2005
ISSN: 0030-4026
DOI: 10.1016/j.ijleo.2005.01.020